| Penerbit | : Springer |
| Tahun Terbit | : 2018 |
| Kota | : New York |
| Penulis | : Joseph I. Goldstein Dale E. Newbury Joseph R. Michael Nicholas W.M. Ritchie John Henry J. Scott David C. Joy |
File Digital
| # | File | Aksi |
|---|---|---|
| 1 | 1692200487144-1-Scanning-Electron-Microscopy-and-X-Ray-Microanalysis-(-PDFDrive-).pdf |
